Antonovsky A
CRA-Advanced Technical Development, W.A. Technology Park, Bentley, Western Australia.
Microsc Res Tech. 1995 Jul 1;31(4):300-7. doi: 10.1002/jemt.1070310407.
Industrial materials, such as alumina, often pose difficulties in their preparation for TEM examination. Composite and particulate materials are particularly difficult to prepare using conventional thinning techniques, i.e., ion beam and chemical jet thinning. Ultramicrotomy (UM) can be used to produce TEM specimens with a uniform thickness and an unaltered composition. Some crystalline materials, i.e., alumina hydrate, were difficult to section due to conflict between the cutting direction and cleavage planes. Sectioning was successful when these two directions were mutually parallel or perpendicular. At other orientations shattering occurred. Microcrystalline particulate materials, i.e., calcined alumina, were sectioned successfully in particles < 70 microns in diameter. The phases found in industrial alumina particles were gamma, delta, theta, and alpha alumina. Gamma alumina consisted of fine-grained, equiaxed crystallites. The selected area electron diffraction (SAED) patterns indicated poor crystallinity with a distinct hexagonal texture. Delta and theta alumina appeared as an undifferentiated intermediary microstructure of elongated grains. The SAED patterns indicated poor crystallinity, but without a distinct texture. Alpha alumina was found to be a coarse-grained crystalline phase with high diffraction contrast. SAED patterns consisted of fine, randomly oriented spots. Considerable variation was observed in the distribution of phases. In some specimens, discrete particles of gamma and alpha predominated. In others, particles were a mixture of phases representative of the bulk composition. To characterise these samples, TEM of numerous whole particles was required. Ultramicrotomy was the only preparation technique capable of producing such samples.
工业材料,如氧化铝,在制备用于透射电子显微镜(TEM)检查的样品时常常会遇到困难。复合材料和颗粒材料尤其难以使用传统的减薄技术来制备,即离子束减薄和化学喷注减薄。超薄切片术(UM)可用于制备具有均匀厚度且成分未改变的TEM样品。一些晶体材料,如水合氧化铝,由于切割方向与解理面之间的冲突而难以切片。当这两个方向相互平行或垂直时,切片成功。在其他取向时则会发生破碎。微晶颗粒材料,如煅烧氧化铝,对于直径小于70微米的颗粒能够成功切片。在工业氧化铝颗粒中发现的相有γ、δ、θ和α氧化铝。γ氧化铝由细晶粒、等轴微晶组成。选区电子衍射(SAED)图谱显示结晶度较差且具有明显的六边形织构。δ和θ氧化铝呈现为细长晶粒的未分化中间微观结构。SAED图谱显示结晶度较差,但没有明显的织构。α氧化铝是一种具有高衍射对比度的粗晶粒结晶相。SAED图谱由细小、随机取向的斑点组成。观察到相的分布有相当大的差异。在一些样品中,γ和α的离散颗粒占主导。在其他样品中,颗粒是代表整体成分的相的混合物。为了表征这些样品,需要对大量完整颗粒进行TEM分析。超薄切片术是唯一能够制备此类样品的制备技术。