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一种直流漂移伪影的校正方法。

A correction method for DC drift artifacts.

作者信息

Hennighausen E, Heil M, Rösler F

机构信息

Philipps University, Marburg, Germany.

出版信息

Electroencephalogr Clin Neurophysiol. 1993 Mar;86(3):199-204. doi: 10.1016/0013-4694(93)90008-j.

Abstract

In order to cope with the problem of drift artifacts in ERP research a new off-line correction method is described. It estimates the DC drift from all prestimulus baselines of an experiment. For this end, an amplifier reset is performed at regular intervals and the DC off-set preceding any reset is stored. A regression is calculated between the prestimulus baseline amplitudes of consecutive trials and the time that has passed by. The amplitude trend which can be explained by either a linear or non-linear regression model is then subtracted from all data points. The power of the method is illustrated by two examples. The first shows that detrending increases the signal-to-noise ratio in ANOVA designs. The second shows that amplitude differences of event-related slow potentials, which appeared between the first and the second half of an experiment, could be explained by a non-linear drift component.

摘要

为了应对事件相关电位(ERP)研究中的基线漂移伪迹问题,本文描述了一种新的离线校正方法。该方法从实验的所有刺激前基线估计直流漂移。为此,以固定间隔进行放大器复位,并存储每次复位前的直流偏移。计算连续试验的刺激前基线幅度与经过时间之间的回归。然后从所有数据点中减去由线性或非线性回归模型解释的幅度趋势。通过两个例子说明了该方法的有效性。第一个例子表明,去趋势处理增加了方差分析设计中的信噪比。第二个例子表明,实验前半段和后半段之间出现的事件相关慢电位的幅度差异可以由非线性漂移成分来解释。

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