Parker M A, Vesely D
Department of Materials Technology, Brunel University, Uxbridge, Middlesex, United Kingdom.
Microsc Res Tech. 1993 Mar 1;24(4):333-9. doi: 10.1002/jemt.1070240406.
A new technique for the identification of phases contained within a polymer blend is described in this paper. The technique utilises the beam damage which occurs when polymers are irradiated in an electron microscope. It has been found that during the irradiation process isolated double bonds are formed which can be revealed by staining with osmium tetroxide. The density of staining and its relationship to electron exposure is shown to be a characteristic feature of a particular chemical structure. It allows for polymer phase identification with a high spatial resolution and also for contrast enhancement and preservation. This technique offers a unique way of studying a fine dispersion of phases in polymer blends, even where only low atomic number elements such as C, H, and O are present.
本文描述了一种用于识别聚合物共混物中所含相的新技术。该技术利用了聚合物在电子显微镜中辐照时发生的束损伤。已发现，在辐照过程中会形成孤立的双键，这些双键可用四氧化锇染色显示出来。染色密度及其与电子曝光的关系被证明是特定化学结构的一个特征。它能够以高空间分辨率识别聚合物相，还能增强对比度并加以保留。即使在仅存在碳、氢和氧等低原子序数元素的情况下，该技术也为研究聚合物共混物中相的精细分散提供了一种独特的方法。
