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二元诊断试验有效性的机遇校正测量指标。

Chance-corrected measures of the validity of a binary diagnostic test.

作者信息

Brenner H, Gefeller O

机构信息

Unit of Epidemiology, University of Ulm, Germany.

出版信息

J Clin Epidemiol. 1994 Jun;47(6):627-33. doi: 10.1016/0895-4356(94)90210-0.

Abstract

Chance-corrected measures of the validity of diagnostic tests can be a valuable supplement to traditional measures which do not take chance-agreement between diagnostic test and true disease status into account. Recently, several authors have propagated chance-corrected measures of sensitivity and specificity, the most commonly employed indices of validity of binary diagnostic tests. A major limitation of these measures is their dependence on disease prevalence. In this paper, we propose simple alternative chance-corrected measures of sensitivity and specificity which do not share this limitation. The chance-corrected measure of sensitivity can be expressed as 1--negative likelihood ratio, and the chance-corrected measure of specificity can be expressed as 1--inverse of the positive likelihood ratio. The properties of the proposed measures are described and graphically illustrated, and formulas are given for point and interval estimation of the measures.

摘要

诊断试验有效性的机会校正测量方法可以作为传统测量方法的有价值补充,传统测量方法未考虑诊断试验与真实疾病状态之间的偶然一致性。最近,几位作者推广了敏感性和特异性的机会校正测量方法,这是二元诊断试验最常用的有效性指标。这些测量方法的一个主要局限性是它们依赖于疾病患病率。在本文中,我们提出了敏感性和特异性的简单替代机会校正测量方法,这些方法不存在这一局限性。敏感性的机会校正测量方法可以表示为1减去阴性似然比,特异性的机会校正测量方法可以表示为1减去阳性似然比的倒数。描述并以图形方式说明了所提出测量方法的性质,并给出了这些测量方法的点估计和区间估计公式。

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