通过原子力显微镜和透射电子显微镜对医用级超高分子量聚乙烯微观结构的比较

Comparison of medical-grade ultrahigh molecular weight polyethylene microstructure by atomic force microscopy and transmission electron microscopy.

作者信息

Vallotton P H, Denn M M, Wood B A, Salmeron M B

机构信息

Department of Chemical Engineering, University of California, Berkeley 94720.

出版信息

J Biomater Sci Polym Ed. 1994;6(7):609-20. doi: 10.1163/156856294x00554.

DOI:10.1163/156856294x00554

PMID:7873512

Abstract

Atomic force microscopy is used to image the topography of surfaces of bulk medical-grade ultrahigh molecular weight polyethylene (UHMWPE). Comparison with transmission electron microscopy images demonstrates that the AFM can resolve the plate-like stacks of crystalline lamellae characteristic of UHMWPE without aggressive surface treatment. Surface preparation for the AFM must be carried out by cryomicrotomy at extremely low temperatures to prevent smearing of surface features. Chemically-etched surfaces of UHMWPE require substantially less surface preparation for AFM imaging.

摘要

原子力显微镜用于对块状医用级超高分子量聚乙烯（UHMWPE）表面的形貌进行成像。与透射电子显微镜图像的比较表明，原子力显微镜无需进行苛刻的表面处理就能分辨出UHMWPE特有的片状晶体片层堆叠结构。原子力显微镜的表面制备必须在极低温度下通过冷冻切片术进行，以防止表面特征被 smear。UHMWPE 的化学蚀刻表面在进行原子力显微镜成像时所需的表面制备要少得多。（注：原文中“smearing”在医学语境中结合上下文推测可能是“涂抹、模糊”等意思，这里直接保留英文是因为不确定准确含义，在准确理解后可替换更合适的中文表述）