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内壳层电离现象在重离子导致细胞失活中的可能作用。

Possible role of inner-shell ionization phenomena in cell inactivation by heavy ions.

作者信息

Chetioui A, Despiney I, Guiraud L, Adoui L, Sabatier L, Dutrillaux B

机构信息

Groupe de Physique des Solides, CNRS URA 017, Universités Paris 7, France.

出版信息

Int J Radiat Biol. 1994 May;65(5):511-22. doi: 10.1080/09553009414550601.

Abstract

The existence of a correlation between experimental probabilities of cell inactivation by charged particles and calculated probabilities for K-vacancy production in heavy atoms (C, N, O, P) of the DNA of cell nuclei is established. Both phenomena display a similar dependence upon the linear energy transfer (LET) of incident particles. In particular for low LET values, K cross sections for various incident ions have nearly the same functional dependence on ion-LET and for higher LET-values, K cross sections display maxima which look like those of inactivation cross sections. These characteristics are well-understood features of the K-ionization phenomenon, in particular the maxima of probability occur for projectile velocities near orbital velocities of the ejected electrons. The meaning of the observed correlation is discussed in terms of deposited energy and in the light of existing experimental results on cell inactivation by X-ray absorption at K-threshold. We consider a mechanism which has already been evoked to explain these photo-absorption experiments and which assumes that a K ionization triggers a double-strand break by Coulomb explosion and energy dissipation of Auger electrons. However, it is seen that K cross sections are important for C, N and O atoms but negligible for P atoms. Thus, the lesion considered here affects other atoms than those involved in the K-photoabsorption experiments. The lesion efficiency with respect to subsequent double-strand breakage and repair processes is not yet known, however one may suspect a direct link between DNA blunt ends possibly induced by such K ionizations and cell inactivation.

摘要

已证实带电粒子使细胞失活的实验概率与细胞核DNA中重原子(碳、氮、氧、磷)产生K空位的计算概率之间存在相关性。这两种现象对入射粒子的线能量转移(LET)都表现出相似的依赖性。特别是对于低LET值,各种入射离子的K截面与离子LET几乎具有相同的函数依赖性;对于较高的LET值,K截面呈现出最大值,其形状类似于失活截面的最大值。这些特征是K电离现象的常见特征,特别是概率最大值出现在入射粒子速度接近被弹出电子的轨道速度时。根据沉积能量并结合关于K阈值处X射线吸收导致细胞失活的现有实验结果,讨论了所观察到的相关性的意义。我们考虑一种已经被用来解释这些光吸收实验的机制,该机制假设K电离通过库仑爆炸和俄歇电子的能量耗散引发双链断裂。然而,可以看出,K截面对于碳、氮和氧原子很重要,但对于磷原子可以忽略不计。因此,这里考虑的损伤涉及的原子与K光吸收实验中涉及的原子不同。关于随后的双链断裂和修复过程的损伤效率尚不清楚,不过人们可能会怀疑这种K电离可能诱导的DNA平端与细胞失活之间存在直接联系。

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