Kelly P M, Wauchope C J, Zhang X
Department of Mining and Metallurgical Engineering, University of Queensland, Australia.
Microsc Res Tech. 1994 Aug 1;28(5):448-51. doi: 10.1002/jemt.1070280512.
A simple formula has been derived for the tilt angle of a specimen in terms of the two tilt angles of a side entry, double tilt holder in a transmission electron microscope. An expression for calculating the direction of the apparent tilt axis in relation to the observed diffraction pattern has also been derived. The accuracy and reproducibility of specimen tilting has been assessed experimentally.
已推导出一个简单公式，用于根据透射电子显微镜中侧入式双倾台的两个倾斜角度来计算样品的倾斜角。还推导出了一个表达式，用于计算表观倾斜轴相对于观察到的衍射图案的方向。已通过实验评估了样品倾斜的准确性和可重复性。
