Jones G D, Milligan J R, Ward J F, Calabro-Jones P M, Aguilera J A
Department of Radiology-0610, University of California at San Diego, La Jolla 92093-0610.
Radiat Res. 1993 Nov;136(2):190-6.
We have measured by gel electrophoresis the yields of single- and double-strand breaks (SSBs and DSBs) induced in aqueous solutions of SV40 DNA and the SV40 minichromosome by 137Cs gamma rays (mean LET 0.3 keV micron-1) and 4He ions (mean LETs 85, 102, and 152 keV microns-1). DNA SSBs are caused mainly by the hydroxyl radicals under these conditions and are reduced in yield as either the hydroxyl radical scavenger concentration or the LET is increased (over the range studied). The G(SSB) for 4He ion irradiation is less by a factor of up to 10 than the G(SSB) for gamma irradiation, depending upon the scavenger concentration. The difference in the yields of SSBs agrees well with the difference in the yields of hydroxyl radicals for the radiations in question. In contrast, the yields of DSBs are similar for gamma and 4He ion irradiation over much of the range of scavenging capacity studied. However, at the highest scavenger concentrations the yields of DSBs are greater for 4He ion irradiation. In addition, the yields of DSBs remain almost constant with increasing LET (over the range studied). Therefore the relative yield of DSBs per SSB increases with increasing LET, supporting the hypothesis that increasing LET leads to an increased clustering of damage in DNA.
我们通过凝胶电泳测量了137Csγ射线(平均传能线密度为0.3 keV·μm-1)和4He离子(平均传能线密度分别为85、102和152 keV·μm-1)在SV40 DNA水溶液和SV40微型染色体中诱导产生的单链断裂(SSB)和双链断裂(DSB)的产额。在这些条件下,DNA单链断裂主要由羟基自由基引起,并且随着羟基自由基清除剂浓度或传能线密度的增加(在所研究的范围内),其产额会降低。根据清除剂浓度的不同,4He离子辐照的G(SSB)比γ辐照的G(SSB)低至10倍。单链断裂产额的差异与所讨论辐射的羟基自由基产额差异非常吻合。相比之下,在研究的大部分清除能力范围内,γ射线和4He离子辐照的双链断裂产额相似。然而,在最高清除剂浓度下,4He离子辐照的双链断裂产额更高。此外,随着传能线密度的增加(在所研究的范围内),双链断裂产额几乎保持不变。因此,双链断裂与单链断裂的相对产额随着传能线密度的增加而增加,这支持了传能线密度增加会导致DNA损伤聚集增加的假设。