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根据轴上和离轴的申普夫鲁格照片估算晶状体厚度。

Estimation of the thickness of the crystalline lens from on-axis and off-axis Scheimpflug photographs.

作者信息

Sparrow J M, Brown N A, Bron A J

机构信息

Nuffield Laboratory of Ophthalmology, University of Oxford, UK.

出版信息

Ophthalmic Physiol Opt. 1993 Jul;13(3):291-4. doi: 10.1111/j.1475-1313.1993.tb00471.x.

Abstract

Measurement of human lens biometry directly from Scheimpflug images of the anterior ocular segment may be impossible when pupil size precludes an adequate Scheimpflug view of the posterior lens surface. The authors describe a simple and accurate geometric method of overcoming this problem by estimating the true lens thickness from pairs of on-axis and off-axis Scheimpflug images. The method is validated and the variability of the estimate is quantified. This new method has utility in the study of lens biometry in subjects with large lenses whose pupils cannot be adequately dilated.

摘要

当瞳孔大小妨碍对晶状体后表面进行足够的Scheimpflug观察时,直接从眼前节的Scheimpflug图像测量人晶状体生物特征可能是不可能的。作者描述了一种简单而准确的几何方法来克服这个问题,即通过一对同轴和离轴Scheimpflug图像估计晶状体的真实厚度。该方法经过验证,并对估计的变异性进行了量化。这种新方法在研究晶状体较大且瞳孔无法充分散大的受试者的晶状体生物特征方面具有实用性。

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