Brantley W A, Cai Z, Papazoglou E, Mitchell J C, Kerber S J, Mann G P, Barr T L
Section of Restorative Dentistry, Prosthodontics and Endodontics, College of Dentistry, Ohio State University, Columbus, USA.
Dent Mater. 1996 Nov;12(6):333-41. doi: 10.1016/s0109-5641(96)80043-1.
The purpose of this study was to use x-ray diffraction (XRD) to obtain new information about the oxide layers on four representative oxidized high-palladium alloys.
Cast specimens of two Pd-Cu-Ga alloys and two Pd-Ga alloys, with both polished and etched surfaces and air-abraded surfaces, were subjected to oxidation procedures recommended by the manufacturers. The specimens were analyzed by x-ray diffraction using CuK alpha radiation, and the peaks were compared to appropriate Joint Committee on Powder Diffraction Standards (JCPDS).
The surface preparation procedure had a profound effect on the phases present in the oxide layers. For the specimens that had been polished and etched, CuGa2O4 and beta-Ga2O3 were detected on the 79Pd-10Cu-9Ga-2Au alloy, whereas SnO2 and CuGa2O4 were detected on the 76Pd-10Cu-5.5Ga-6Sn-2Au alloy. The oxide layers on both Pd-Cu-Ga alloys contained Cu2O1 and the oxide layer on the 76Pd-10Cu-5.5Ga-6Sn-2Au alloy may contain beta-Ga2O3. The principal phase in the oxide layers on both Pd-Ga alloys that had been polished and etched was ln2O3, which exhibited extreme preferred orientation. No other phase was detected in the oxide layer on the 85Pd-10Ga-2Au-1Ag-1 ln alloy, whereas beta-Ga2O3 was found in the oxide layer on the 75Pd-6Ga-6Au-6Ag-6.5ln alloy. For the air-abraded specimens, beta-Ga2O2 was not present in the oxide layers on the Pd-Cu-Ga alloys, and beta-Ga2O3 was the major phase in the oxide layers on the Pd-Ga alloys. Palladium oxide(s) in varying amounts were detected for both surface preparations of the Pd-Cu-Ga alloys and for the air-abraded Pd-Ga alloys. Except for the 76Pd-10Cu-5.5Ga-6Sn-2Au alloy, the oxide layer caused minimal change in the lattice parameter of the palladium solid solution compared to that for the as-cast alloy.
Knowledge of the phases found in the oxide layers on these high-palladium alloys is of fundamental importance for interpreting differences in the adherence of dental porcelain to the metal substrates under static and dynamic conditions, and may provide guidance in the development of new high-palladium alloys with improved metal-ceramic bonding.
本研究旨在利用X射线衍射（XRD）获取有关四种代表性氧化高钯合金氧化层的新信息。
两种钯 - 铜 - 镓合金和两种钯 - 镓合金的铸造试样，其表面有抛光和蚀刻处理以及空气磨蚀处理，按照制造商推荐的氧化程序进行处理。使用铜Kα辐射通过X射线衍射对试样进行分析，并将峰与适当的粉末衍射标准联合委员会（JCPDS）数据进行比较。
表面处理程序对氧化层中存在的相有深远影响。对于经过抛光和蚀刻的试样，在79Pd - 10Cu - 9Ga - 2Au合金上检测到CuGa₂O₄和β - Ga₂O₃，而在76Pd - 10Cu - 5.5Ga - 6Sn - 2Au合金上检测到SnO₂和CuGa₂O₄。两种钯 - 铜 - 镓合金的氧化层都含有Cu₂O₁，并且76Pd - 10Cu - 5.5Ga - 6Sn - 2Au合金的氧化层可能含有β - Ga₂O₃。经过抛光和蚀刻的两种钯 - 镓合金氧化层中的主要相是In₂O₃，其表现出极强的择优取向。在85Pd - 10Ga - 2Au - 1Ag - 1In合金的氧化层中未检测到其他相，而在75Pd - 6Ga - 6Au - 6Ag - 6.5In合金的氧化层中发现了β - Ga₂O₃。对于空气磨蚀的试样，钯 - 铜 - 镓合金的氧化层中不存在β - Ga₂O₂，并且钯 - 镓合金氧化层中的主要相是β - Ga₂O₃。对于钯 - 铜 - 镓合金的两种表面处理以及空气磨蚀的钯 - 镓合金，都检测到了不同含量的钯氧化物。除了76Pd - 10Cu - 5.5Ga - 6Sn - 2Au合金外，与铸态合金相比，氧化层对钯固溶体晶格参数的影响最小。
了解这些高钯合金氧化层中发现的相对于解释在静态和动态条件下牙科陶瓷与金属基底之间附着差异至关重要，并且可能为开发具有改进金属 - 陶瓷结合性能的新型高钯合金提供指导。
