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极低频电磁场诱导人白血病细胞系HL-60发生凋亡性细胞死亡:体外可能机制的分析

Induction of apoptotic cell death in human leukemic cell line, HL-60, by extremely low frequency electric magnetic fields: analysis of the possible mechanisms in vitro.

作者信息

Narita K, Hanakawa K, Kasahara T, Hisamitsu T, Asano K

机构信息

Department of Physiology, School of Medicine, Showa University, Tokyo, Japan.

出版信息

In Vivo. 1997 Jul-Aug;11(4):329-35.

PMID:9292300
Abstract

The influence of extremely low frequency electric magnetic fields. (ELF EMFs) on apoptotic cell death was examined using a human leukemic cell line, HL-60 and normal human peripheral blood leukocytes. When HL-60 cells were exposed to 45 mT ELF EMFs, apoptotic cell death, characterized by cell shrinkage, nuclear fragmentation and cleavage of internucleosomal DNA to yield fragments that were multiples of 180-200 base pairs, were induced. The minimum periods required apoptotic HL-60 cell death was 1.0 hour. However, exposure to ELF EMFs could not produce detectable DNA fragmentation in human peripheral blood leukocytes. Static magnetic fields could not induce apoptotic cell death in HL-60 cells, even when the cells were exposed to 180 mT of magnetism for 3.5 hours. We further examined whether hyperthermia induced by induction current in ELF EMFs produced apoptosis in HL-60 cells. Induction current in ELF EMFs enhanced temperature of culture medium to 40.3 degrees C at 3.0 hours of exposure. However, this level of temperature could not induced apoptotic cell death in HL-60 cells, even when cells were cultured for 3.5 hours. These results suggest that induction current produced by ELF EMFs may be one of main mediator in apoptosis in HL-60 cells.

摘要

极低频电磁场(ELF EMFs)对凋亡性细胞死亡的影响,通过使用人白血病细胞系HL - 60和正常人外周血白细胞进行了检测。当HL - 60细胞暴露于45 mT的ELF EMFs时,诱导了凋亡性细胞死亡,其特征为细胞皱缩、核碎裂以及核小体间DNA裂解产生180 - 200碱基对倍数的片段。诱导HL - 60细胞凋亡性死亡所需的最短时间为1.0小时。然而,暴露于ELF EMFs在人外周血白细胞中未产生可检测到的DNA片段化。静磁场即使在细胞暴露于180 mT磁场3.5小时的情况下,也不能诱导HL - 60细胞凋亡性死亡。我们进一步研究了ELF EMFs中的感应电流所诱导的热疗是否会导致HL - 60细胞凋亡。在暴露3.0小时时,ELF EMFs中的感应电流使培养基温度升高至40.3摄氏度。然而,即使细胞培养3.5小时,这种温度水平也不能诱导HL - 60细胞凋亡性死亡。这些结果表明,ELF EMFs产生的感应电流可能是HL - 60细胞凋亡的主要介导因素之一。

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