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通过原子力显微镜(AFM)对隐形眼镜表面进行检测。

Examination of contact lens surfaces by Atomic Force Microscope (AFM).

作者信息

Bhatia S, Goldberg E P, Enns J B

机构信息

Department of Materials Science and Engineering, University of Florida, Gainesville 32611, USA.

出版信息

CLAO J. 1997 Oct;23(4):264-9.

PMID:9348451
Abstract

PURPOSE

We evaluated the use of Atomic Force Microscopy (AFM) in examining the surfaces of unused and worn hydrogel contact lenses under natural, fully hydrated conditions.

METHODS

Using the AFM contact mode, we examined hydrogel lenses (Acuvue, Surevue, NewVues, CSI Clarity, SeeQuence) that were hydrated.

RESULTS

Surface morphologies characteristics of each lens type and wear history were readily observed. The surfaces of worn lenses showed evidence of abrasion and altered morphology. These changes varied with type of contact lens and conditions of use and by site on the lens.

CONCLUSIONS

AFM is a very powerful tool for high resolution examination of hydrated contact lens surface structure. The method avoids artifacts due to dehydration and coating which can occur even with low voltage Scanning Electron Microscopy. Significant differences in contact lens surface morphology were observed before and after wear. These observations may be of importance in helping develop improved new lens polymers and ocular solutions.

摘要

目的

我们评估了原子力显微镜(AFM)在自然、完全水合条件下检查未使用和磨损的水凝胶隐形眼镜表面的应用。

方法

使用AFM接触模式,我们检查了水合的水凝胶镜片(Acuvue、Surevue、NewVues、CSI Clarity、SeeQuence)。

结果

每种镜片类型和佩戴史的表面形态特征都很容易观察到。磨损镜片的表面显示出磨损和形态改变的迹象。这些变化因隐形眼镜类型、使用条件以及镜片上的位置而异。

结论

AFM是用于高分辨率检查水合隐形眼镜表面结构的非常强大的工具。该方法避免了即使在低电压扫描电子显微镜下也可能出现的脱水和涂层伪像。观察到佩戴前后隐形眼镜表面形态有显著差异。这些观察结果可能有助于开发改进的新型镜片聚合物和眼用溶液。

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