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一些陶瓷中界面及其他结构缺陷的高分辨率电子显微镜研究。

High resolution electron microscopy investigations of interface and other structure defects in some ceramics.

作者信息

Wen S, Liu Q

机构信息

Shanghai Institute of Ceramics, Chinese Academy of Sciences.

出版信息

Microsc Res Tech. 1998 Feb 1;40(3):177-86. doi: 10.1002/(SICI)1097-0029(19980201)40:3<177::AID-JEMT2>3.0.CO;2-S.

DOI:10.1002/(SICI)1097-0029(19980201)40:3<177::AID-JEMT2>3.0.CO;2-S
PMID:9518053
Abstract

Interface, grain boundary, and other structure defects are the most important structural factors to affect the properties of ceramics materials. The present paper shows the relationship between the properties and those structure features such as grain boundaries, phase boundaries, interfaces, twins, intergrowths, dislocations, point defect aggregates, order-disorder, and other structure defects in different kinds of ceramics materials. At present this research covers: C60, sialon-based ceramics (alpha-sialon/SiC(w) composite, Y-alpha-sialon/beta-sialon composite), high Tc superconductors (YBa2Cu3O7, YBa2Cu4O8, Bi2Sr2CaCu2O8, Bi2Sr2Ca2Cu3O10), and bioceramics (hydroxyapatite, chlorapatite) and so on. The structure features mentioned above were characterized by high-resolution electron microscopy; so the structure details are at an atomic level and the related physical, chemical, engineering, even biological phenomena can be understood at an atomic and molecular level.

摘要

界面、晶界及其他结构缺陷是影响陶瓷材料性能的最重要结构因素。本文展示了不同种类陶瓷材料的性能与诸如晶界、相界、界面、孪晶、共生体、位错、点缺陷聚集体、有序-无序及其他结构缺陷等结构特征之间的关系。目前该研究涵盖:C60、赛隆基陶瓷(α-赛隆/碳化硅(w)复合材料、Y-α-赛隆/β-赛隆复合材料)、高温超导体(钇钡铜氧7、钇钡铜氧8、铋锶钙铜氧8、铋锶钙二铜氧10)以及生物陶瓷(羟基磷灰石、氯磷灰石)等。上述结构特征通过高分辨率电子显微镜进行表征;因此结构细节处于原子层面,相关的物理、化学、工程甚至生物学现象都能在原子和分子层面得到理解。

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