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原子力显微镜图像中革兰氏阴性菌和革兰氏阳性菌的表面特征。

Surface characteristics of gram-negative and gram-positive bacteria in an atomic force microscope image.

作者信息

Umeda A, Saito M, Amako K

机构信息

Department of Bacteriology, Faculty of Medicine, Kyushu University, Fukuoka, Fukuoka, Japan.

出版信息

Microbiol Immunol. 1998;42(3):159-64. doi: 10.1111/j.1348-0421.1998.tb02266.x.

Abstract

Bacterial images can be obtained rather easily with an atomic-force microscope (AFM) in the magnification range of 5,000 to 30,000 times without any pretreatment of the specimens for such observations as chemical fixation, dehydration or staining. The bacterial shapes or the presence of flagella can be clearly recognized in these magnification ranges. In addition, we were also able to distinguish between gram-negative and gram-positive bacteria based on the specific wavy surface appearance of the former. AFM could thus be a useful tool for the identification of bacteria in the resolution range between electron and light microscopy.

摘要

使用原子力显微镜(AFM)可以相当容易地获得细菌图像,放大倍数在5000至30000倍之间,无需对标本进行任何预处理,如化学固定、脱水或染色等观察前处理。在这些放大倍数范围内,可以清楚地识别细菌的形状或鞭毛的存在。此外,基于革兰氏阴性菌特有的波浪状表面外观,我们还能够区分革兰氏阴性菌和革兰氏阳性菌。因此,在电子显微镜和光学显微镜之间的分辨率范围内,AFM可能是一种用于细菌鉴定的有用工具。

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