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[电离子性炎症作为髋关节置换术中无菌性植入物松动的原因(作者译)]

[Electrogalvonic inflammation as the cause of aseptic implant loosening in alloarthroplasty of the hip joint (author's transl)].

作者信息

Breitenfelder J, Weidner R

出版信息

Z Orthop Ihre Grenzgeb. 1976 Oct;114(5):867-70.

PMID:997745
Abstract

The appearance of pronounced cavity formation and erosion of the cortex layer in the area of the prosthetic shaft following total endoprosthetic implantation, without signs of an acute bacterial inflammatory activity, was investigated in specimens from the Orthopedic Hospital, Würzburg. The causes of these alterations, in most cases, could be electrogalvonic tension which produces inflammatory processes with lacunar disintegration of the cortex layer. In this process, the metal implant is loosened. In vitro experiments have shown that an average difference in potential of 290 mV can be established between both electrodes of the metal implant.

摘要

在维尔茨堡骨科医院的标本中,研究了全关节置换术后假体柄区域明显的空洞形成和皮质层侵蚀现象,且无急性细菌性炎症活动迹象。在大多数情况下,这些改变的原因可能是电偶张力,它会引发炎症过程,导致皮质层出现腔隙性崩解。在此过程中,金属植入物会松动。体外实验表明,金属植入物的两个电极之间可形成平均290 mV的电位差。

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