Identification of strained silicon layers at Si-SiO2 interfaces and clean Si surfaces by nonlinear optical spectroscopy.
作者信息
Daum W, Krause H, Reichel U, Ibach H
出版信息
Phys Rev Lett. 1993 Aug 23;71(8):1234-1237. doi: 10.1103/PhysRevLett.71.1234.
PMID:10055484
Abstract
摘要
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