Grandbois M, Beyer M, Rief M, Clausen-Schaumann H, Gaub HE
Lehrstuhl fur Angewandte Physik, Ludwig-Maximilians-Universitat, Amalienstrasse 54, D-80799 Munchen, Germany. Institut fur Physikalische und Theoretische Chemie, Technische Universitat Munchen, Lichtenbergstrasse 4, 85748 Garching.
Science. 1999 Mar 12;283(5408):1727-30. doi: 10.1126/science.283.5408.1727.
The rupture force of single covalent bonds under an external load was measured with an atomic force microscope (AFM). Single polysaccharide molecules were covalently anchored between a surface and an AFM tip and then stretched until they became detached. By using different surface chemistries for the attachment, it was found that the silicon-carbon bond ruptured at 2.0 +/- 0.3 nanonewtons, whereas the sulfur-gold anchor ruptured at 1.4 +/- 0.3 nanonewtons at force-loading rates of 10 nanonewtons per second. Bond rupture probability calculations that were based on density functional theory corroborate the measured values.
使用原子力显微镜（AFM）测量了外部负载下单共价键的断裂力。单个多糖分子通过共价键固定在表面和AFM探针之间，然后拉伸直至分离。通过使用不同的表面化学方法进行固定，发现硅 - 碳键在2.0±0.3纳牛顿的力下断裂，而硫 - 金固定在每秒10纳牛顿的力加载速率下在1.4±0.3纳牛顿时断裂。基于密度泛函理论的键断裂概率计算证实了测量值。
