Holmestad R, Birkeland C R, Marthinsen K, Høier R, Zuo J M
Department of Physics, Norwegian University of Science and Technology (NTNU), N-7491 Trondheim, Norway.
Microsc Res Tech. 1999 Jul 15;46(2):130-45. doi: 10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O.
Methods for quantitative convergent-beam electron diffraction are outlined and some results of our applications of convergent-beam electron diffraction are shown, with emphasis on quantitative analysis of crystal structures in materials science. Examples of thickness measurements and determination of lattice parameters are presented. Measurements of low-order structure factors to obtain information on bonding charge-density distributions are reviewed, with examples from TiAl intermetallics. For non-centrosymmetric crystals, a method to determine three-phase structure invariants is given. Determination of polarity is also discussed.
概述了定量会聚束电子衍射方法，并展示了我们应用会聚束电子衍射的一些结果，重点是材料科学中晶体结构的定量分析。给出了厚度测量和晶格参数测定的示例。回顾了通过测量低阶结构因子来获取键电荷密度分布信息的方法，并以TiAl金属间化合物为例。对于非中心对称晶体，给出了一种确定三相结构不变量的方法。还讨论了极性的测定。
