Randle V, Barker I, Ralph B
Department of Materials Technology, Brunel University of West London, Middlesex, England.
J Electron Microsc Tech. 1989 Sep;13(1):51-65. doi: 10.1002/jemt.1060130108.
A brief review is presented of the methods of measuring lattice parameters and strain using diffraction techniques. The presence of strain leads to broadening of diffraction maxima, which is normally separable from any broadening caused by size. The special advantages of the convergent beam electron diffraction (CBED) technique is the local nature from which the data are derived. Examples of the use of CBED techniques in measuring lattice parameters and strain are given from studies of precipitation (including misfit measurements) and from investigations of partially recrystallised microstructures. These examples are used to illustrate the advantages and limitations of the CBED technique.
本文简要回顾了利用衍射技术测量晶格参数和应变的方法。应变的存在会导致衍射峰变宽，这通常可与尺寸引起的任何变宽区分开来。会聚束电子衍射（CBED）技术的特殊优势在于其数据获取的局部性。从沉淀研究（包括错配测量）以及部分再结晶微观结构的研究中给出了CBED技术用于测量晶格参数和应变的实例。这些实例用于说明CBED技术的优点和局限性。
