Xiang X D
Mail-Stop: 2-300, One Cyclotron Road, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.
Biotechnol Bioeng. 1998;61(4):227-41.
Combinatorial materials synthesis methods and high-throughput evaluation techniques have been developed to accelerate the process of materials discovery and optimization and phase-diagram mapping. Analogous to integrated circuit chips, integrated materials chips containing thousands of discrete different compositions or continuous phase diagrams, often in the form of high-quality epitaxial thin films, can be fabricated and screened for interesting properties. Microspot x-ray method, various optical measurement techniques, and a novel evanescent microwave microscope have been used to characterize the structural, optical, magnetic, and electrical properties of samples on the materials chips. These techniques are routinely used to discover/optimize and map phase diagrams of ferroelectric, dielectric, optical, magnetic, and superconducting materials.
组合材料合成方法和高通量评估技术已得到发展，以加速材料发现、优化及相图绘制的进程。类似于集成电路芯片，包含数千种离散的不同成分或连续相图的集成材料芯片（通常为高质量外延薄膜的形式）能够被制造出来，并针对有趣的特性进行筛选。微点X射线法、各种光学测量技术以及一种新型倏逝波微波显微镜已被用于表征材料芯片上样品的结构、光学、磁性和电学性质。这些技术通常用于发现/优化以及绘制铁电、介电、光学、磁性和超导材料的相图。
