Macpherson J V, Unwin P R
Department of Chemistry, University of Warwick, Coventry, U.K.
Anal Chem. 2000 Jan 15;72(2):276-85. doi: 10.1021/ac990921w.
A combined scanning electrochemical microscope (SECM)-atomic force microscope (AFM) is described. The instrument permits the first simultaneous topographical and electrochemical measurements at surfaces, under fluid, with high spatial resolution. Simple probe tips suitable for SECM-AFM, have been fabricated by coating flattened and etched Pt microwires with insulating, electrophoretically deposited paint. The flattened portion of the probe provides a flexible cantilever (force sensor), while the coating insulates the probe such that only the tip end (electrode) is exposed to the solution. The SECM-AFM technique is illustrated with simultaneous electrochemical-probe deflection approach curves, simultaneous topographical and electrochemical imaging studies of track-etched polycarbonate ultrafiltration membranes, and etching studies of crystal surfaces.
描述了一种组合式扫描电化学显微镜（SECM）-原子力显微镜（AFM）。该仪器能够首次在流体环境下对表面进行高空间分辨率的同时形貌和电化学测量。通过用绝缘的电泳沉积涂料涂覆扁平且蚀刻过的铂微丝，制备了适用于SECM-AFM的简单探针尖端。探针的扁平部分提供了一个柔性悬臂（力传感器），而涂层使探针绝缘，使得只有尖端（电极）暴露于溶液中。通过同时进行电化学-探针偏转逼近曲线、径迹蚀刻聚碳酸酯超滤膜的同时形貌和电化学成像研究以及晶体表面蚀刻研究，展示了SECM-AFM技术。
