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低能(3至20电子伏特)电子导致DNA链断裂的共振形成。

Resonant formation of DNA strand breaks by low-energy (3 to 20 eV) electrons.

作者信息

Boudaïffa B, Cloutier P, Hunting D, Huels M A, Sanche L

机构信息

Canadian Medical Research Council Group in Radiation Sciences, Department of Nuclear Medicine and Radiobiology, Faculty of Medicine, University of Sherbrooke, Québec J1H 5N4, Canada.

出版信息

Science. 2000 Mar 3;287(5458):1658-60. doi: 10.1126/science.287.5458.1658.

Abstract

Most of the energy deposited in cells by ionizing radiation is channeled into the production of abundant free secondary electrons with ballistic energies between 1 and 20 electron volts. Here it is shown that reactions of such electrons, even at energies well below ionization thresholds, induce substantial yields of single- and double-strand breaks in DNA, which are caused by rapid decays of transient molecular resonances localized on the DNA's basic components. This finding presents a fundamental challenge to the traditional notion that genotoxic damage by secondary electrons can only occur at energies above the onset of ionization, or upon solvation when they become a slowly reacting chemical species.

摘要

电离辐射在细胞中沉积的大部分能量被用于产生大量具有1至20电子伏特弹道能量的自由二次电子。本文表明,即使在远低于电离阈值的能量下,这些电子的反应也会在DNA中诱导产生大量的单链和双链断裂,这是由定位于DNA基本成分上的瞬态分子共振的快速衰减引起的。这一发现对传统观念提出了根本性挑战,即二次电子的遗传毒性损伤只能在高于电离起始的能量下发生,或者在它们成为缓慢反应的化学物种时通过溶剂化作用发生。

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