Salvade Y, Dandliker R
Institute of Microtechnology, University of Neuchatel, Switzerland.
J Opt Soc Am A Opt Image Sci Vis. 2000 May;17(5):927-32. doi: 10.1364/josaa.17.000927.
Interferometry with laser diodes is a cost-effective way to perform displacement measurement. The tunability of laser diodes is also of great interest in multiple-wavelength interferometry. However, the additional flicker noise in the frequency-noise spectrum of semiconductor lasers may become a limiting factor. Investigations on the limitations due to the 1/f noise of laser diodes are presented for both classical and multiple-wavelength interferometry. Measurements at the limit of the coherence length of laser diodes with the corresponding phase fluctuations are reported. The theoretical results are verified experimentally.
