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通过使用分子前驱体的氧化反应实现金属氟化物薄膜的自限性生长。

Self-limiting growth of metal fluoride thin films by oxidation reactions employing molecular precursors.

作者信息

Qiu SR, Lai H, Yarmoff JA

机构信息

Department of Physics, University of California, Riverside, California 92521 and Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.

出版信息

Phys Rev Lett. 2000 Aug 14;85(7):1492-5. doi: 10.1103/PhysRevLett.85.1492.

Abstract

FeF (2) films are grown by the reaction of XeF (2) and SeF (6) with iron foil. The growth initially follows the Mott-Cabrera parabolic rate law, indicating that the process is diffusion limited. At a certain film thickness, however, the growth abruptly stops, with the thickness using XeF (2) being nearly double that with SeF (6). It is suggested that the shutdown is due to the inability of the molecules to dissociate when too far from the substrate and that SeF (6) must approach more closely than XeF (2). This work suggests the use of molecular precursors to grow thin films via a self-limiting chemical process.

摘要

通过XeF₂和SeF₆与铁箔反应生长FeF₂薄膜。生长最初遵循莫特-卡布雷拉抛物线速率定律,表明该过程受扩散限制。然而,在一定的薄膜厚度时,生长突然停止,使用XeF₂时的厚度几乎是使用SeF₆时的两倍。据推测,生长停止是由于分子离衬底太远时无法解离,并且SeF₆必须比XeF₂更靠近衬底。这项工作表明可使用分子前驱体通过自限性化学过程生长薄膜。

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