Carminati R, Saenz JJ
Laboratoire d'Energetique Moleculaire et Macroscopique, Combustion, Ecole Centrale Paris, Centre National de la Recherche Scientifique, 92295 Chatenay-Malabry Cedex, France.
Phys Rev Lett. 2000 May 29;84(22):5156-9. doi: 10.1103/PhysRevLett.84.5156.
We propose a new theoretical approach to near-field microscopy, which allows one to deal with scanning tunneling microscopy and scanning near-field optical microscopy with a unified formalism. Under the approximation of weak tip-sample coupling, we show that Bardeen's perturbation formula, originally derived for electron tunneling, can be derived from a scattering formalism which extends its validity to electromagnetic vector fields. This result should find broad applications in near-field imaging and spectroscopy.
我们提出了一种用于近场显微镜的新理论方法，该方法能够用统一的形式体系来处理扫描隧道显微镜和扫描近场光学显微镜。在弱针尖 - 样品耦合的近似条件下，我们表明，最初为电子隧穿推导的巴丁微扰公式，可以从一种散射形式体系推导得出，该形式体系将其有效性扩展到了电磁矢量场。这一结果应在近场成像和光谱学中有广泛应用。
