Swinney K, Bornhop D J
Department of Chemistry and Biochemistry, Texas Tech University, Lubbock 79409-1061, USA.
Analyst. 2000 Oct;125(10):1713-7. doi: 10.1039/b003505j.
An on-chip detector based on backscatter interferometry has been developed to perform sub-nanoliter volume refractive index measurements. The detection system consists of a simple, folded optical train based on the interaction of a laser beam and an etched channel in a silica (glass) plate. This etched channel is composed of two radii joined by a flat portion which define a curved surface in the shape of a half cylinder in a silica (glass) plate. The backscattered light from the channel takes on the form of a high contrast interference pattern that contains information related to the bulk properties of the fluid located within the probe volume. Positional changes of the interference pattern extrema (fringes) allow for the determination of refractive index changes at the 10(-6) level in a detection volume of 188 x 10(-12) L. Under capillary electrophoresis (CE) conditions, the injected mass detection limits for small molecules with little native absorption ranges from 530 fmol (0.18 ng) for sucrose to 720 fmol (0.43 nanograms) for raffinose. Fluorescein was also used to evaluate the technique for universal CE and under further optimized conditions can be quantified at the 150 microM level. Separation performance for the solutes tested ranged from about 2300 to 15,500 plates or 61,000 to 400,000 N m-1. The results presented here indicate there is potential for using the simple optical train of backscattering interferometry for on-chip universal solute analysis.
一种基于背散射干涉测量法的片上探测器已被开发出来,用于进行亚纳升体积的折射率测量。该检测系统由一个简单的折叠光学系统组成,该光学系统基于激光束与石英(玻璃)板中蚀刻通道的相互作用。这个蚀刻通道由两个半径和一个平面部分连接而成,它们在石英(玻璃)板中形成一个半圆柱形的曲面。来自通道的背散射光呈现出高对比度干涉图案的形式,该图案包含与位于探测体积内流体的整体性质相关的信息。干涉图案极值(条纹)的位置变化能够在188×10⁻¹²升的检测体积中测定10⁻⁶水平的折射率变化。在毛细管电泳(CE)条件下,对于几乎没有固有吸收的小分子,注入质量检测限范围从蔗糖的530飞摩尔(0.18纳克)到棉子糖的720飞摩尔(0.43纳克)。荧光素也被用于评估通用毛细管电泳技术,在进一步优化的条件下,其定量水平可达150微摩尔。所测试溶质的分离性能范围约为2300至15500塔板或61000至400000 N m⁻¹。这里展示的结果表明,使用背散射干涉测量法的简单光学系统进行片上通用溶质分析具有潜力。