Eckert-Maksic M, Kazazić S, Kazazić S, Kirin S I, Klasinc L, Srzić D, Zigon D
Ruder Bosković Institute, Bijenicka 54, HR-10000 Zagreb, Croatia.
Rapid Commun Mass Spectrom. 2001;15(7):462-5. doi: 10.1002/rcm.256.
The main electron ionisation induced fragmentation processes of fused norbornene analogues containing SiMe2 or GeMe2 and oxygen bridges, as well as their dependence on substitution, were investigated using mass (MS) and tandem mass (MS/MS) spectrometric analysis. Formation of the rearrangement ions of m/z 176 in the mass spectra of fused norbornene analogues containing SiMe2 and m/z 222 in the mass spectrum of norbornene analogues containing GeMe2 provides firm evidence for the migration of a SiMe2 and GeMe2 bridge, respectively.
使用质谱（MS）和串联质谱（MS/MS）分析，研究了含有SiMe2或GeMe2以及氧桥的稠合降冰片烯类似物的主要电子电离诱导碎裂过程，以及它们对取代基的依赖性。在含有SiMe2的稠合降冰片烯类似物的质谱中形成m/z 176的重排离子，以及在含有GeMe2的降冰片烯类似物的质谱中形成m/z 222的重排离子，分别为SiMe2和GeMe2桥的迁移提供了确凿的证据。
