Ryazanov V V, Oboznov V A, Rusanov A Y, Veretennikov A V, Golubov A A, Aarts J
Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka.
Phys Rev Lett. 2001 Mar 12;86(11):2427-30. doi: 10.1103/PhysRevLett.86.2427.
We report measurements of the temperature dependence of the critical current, I(c), in Josephson junctions consisting of conventional superconducting banks of Nb and a weakly ferromagnetic interlayer of a CuxNi1-x alloy, with x around 0.5. With decreasing temperature I(c) generally increases, but for specific thicknesses of the ferromagnetic interlayer, a maximum is found followed by a strong decrease down to zero, after which I(c) rises again. Such a sharp cusp can be explained only by assuming that the junction changes from a 0-phase state at high temperatures to a pi phase state at low temperatures.
我们报告了对由常规铌超导库和铜镍合金(x约为0.5)的弱铁磁中间层组成的约瑟夫森结中临界电流I(c)的温度依赖性的测量结果。随着温度降低,I(c)通常会增加,但对于铁磁中间层的特定厚度,会出现一个最大值,随后急剧下降至零,之后I(c)再次上升。只有假设该结从高温下的0相态转变为低温下的π相态,才能解释这种尖锐的尖点。