Zhu W, Seve L, Sears R, Sinkovic B, Parkin S S
Physics Department, University of Connecticut, 2152 Hillside Road, Storrs, Connecticut 06269, USA.
Phys Rev Lett. 2001 Jun 4;86(23):5389-92. doi: 10.1103/PhysRevLett.86.5389.
The magnetic anisotropy in antiferromagnetic 500 A thick NiO films, before and after the establishment of an exchange bias field with Co84Fe16 ferromagnetic layers, was measured using magnetic linear dichroism in soft x-ray absorption. Both <111> textured NiO and untextured NiO films show exchange-bias induced in-plane magnetic anisotropy of nearly equal magnitude and with the Ni moment axis being nearly parallel to the exchange bias field direction. These results represent the first observation of the key step in the exchange biasing process, namely, repopulation of the antiferromagnetic domains whose magnetization axis is closest to the exchange bias field direction.
利用软X射线吸收中的磁线性二色性,测量了在与Co84Fe16铁磁层建立交换偏置场之前和之后,500埃厚的反铁磁NiO薄膜中的磁各向异性。<111>织构的NiO薄膜和非织构的NiO薄膜均显示出交换偏置诱导的面内磁各向异性,其大小几乎相等,且Ni矩轴几乎平行于交换偏置场方向。这些结果首次观察到了交换偏置过程中的关键步骤,即磁化轴最接近交换偏置场方向的反铁磁畴的重新分布。