Huang C H, Ma C C
Department of Mechanical Engineering, Ching Yun Institute of Technology, Chung-Li, Taiwan, Republic of China.
J Acoust Soc Am. 2001 Jun;109(6):2780-8. doi: 10.1121/1.1370359.
Electronic speckle pattern interferometry (ESPI) is a full field, non-contact technique for measuring the surface displacement of a structure subjected to static loading or, especially, to dynamic vibration. In this article we employ an optical system called the amplitude-fluctuation ESPI with out-of-plane and in-plane measurements to investigate the vibration characteristics of piezoceramic plates. Two different configurations of piezoceramic plates, namely the rectangular and the circular plates, are discussed in detail. As compared with the film recording and optical reconstruction procedures used for holographic interferometry, the interferometric fringes of AF-ESPI are produced instantly by a video recording system. Because the clear fringe patterns will be shown only at resonant frequencies, both the resonant frequencies and the corresponding mode shapes are obtained experimentally at the same time by the proposed AF-ESPI method. Excellent quality of the interferometric fringe patterns for both the in-plane and out-of-plane vibration mode shapes is demonstrated. The resonant frequencies of the piezoceramic plates are also measured by the conventional impedance analysis. From experimental results, we find that the out-of-plane vibration modes (type A) with lower resonant frequencies cannot be measured by the impedance analysis and only the in-plane vibration modes (type B) will be shown. However, both the out-of-plane (bending) and in-plane (extensional) vibration modes of piezoceramic plates are obtained by the AF-ESPI method. Finally, the numerical finite element calculations are also performed, and the results are compared with the experimental measurements. It is shown that the numerical calculations and the experimental results agree fairly well for both the resonant frequencies and the mode shapes.
电子散斑干涉测量法(ESPI)是一种全场、非接触式技术,用于测量承受静态载荷,尤其是动态振动的结构的表面位移。在本文中,我们采用一种称为振幅波动ESPI的光学系统,进行面外和面内测量,以研究压电陶瓷板的振动特性。详细讨论了两种不同结构的压电陶瓷板,即矩形板和圆形板。与用于全息干涉测量的胶片记录和光学重建过程相比,AF-ESPI的干涉条纹由视频记录系统即时产生。由于清晰的条纹图案仅在共振频率下出现,因此通过所提出的AF-ESPI方法可同时通过实验获得共振频率和相应的振型。展示了面内和面外振动模式振型的干涉条纹图案的优异质量。压电陶瓷板的共振频率也通过传统的阻抗分析进行测量。从实验结果中,我们发现通过阻抗分析无法测量共振频率较低的面外振动模式(A型),仅会显示面内振动模式(B型)。然而,通过AF-ESPI方法可获得压电陶瓷板的面外(弯曲)和面内(拉伸)振动模式。最后,还进行了数值有限元计算,并将结果与实验测量值进行比较。结果表明,共振频率和振型的数值计算与实验结果相当吻合。