Department of Mechanical Engineering, National Taiwan University, Taipei, Taiwan, Republic of China.
IEEE Trans Ultrason Ferroelectr Freq Control. 2009 Dec;56(12):2598-611. doi: 10.1109/TUFFC.2009.1351.
The dynamic characteristics of parallel-type and series-type piezoelectric bimorphs are analyzed in this study. The transverse (out-of-plane) and planar (in-plane) vibrations for piezoceramic bimorphs in normal and abnormal connections are investigated experimentally by 2 noncontact optical techniques and impedance analyzer. Electronic speckle pattern interferometry (ESPI) is the major experimental technique for measuring the resonant frequency and corresponding vibration mode shape. Out-of-plane and in-plane vibrations of piezoelectric bimorphs at resonance are obtained by a self-arranged ESPI optical setup. The laser Doppler vibrometer (LDV) is a point-wise measurement technique for out-of-plane displacement and is used to determine the out-of-plane resonant frequencies. The impedance analyzer is used to measure the resonant frequencies for in-plane motions. It is noted from the experimental results that the out-of-plane modes are the dominant motion for the normal connection and only symmetric vibration mode shapes can be excited. The in-plane motions are large enough to be measured using the ESPI method for normal connections. The in-plane resonant modes are observed for parallel-type piezoelectric bimorph in parallel connections; however, the in-plane mode shapes are similar to the out-of-plane mode shapes for the series-type piezoelectric bimorph in series connection. Hence, the particle motions of the piezoelectric bimorph at resonance are essentially 3-D for the normal connection. It is interesting to note that both symmetric and asymmetric out-of-plane vibration mode shapes can be excited with large applied voltage but no in-plane motion is observed for the abnormal connection. In addition to experimental methods, numerical computations based on the finite element method are used to verify the experimental results. Good agreements of the resonant frequencies and mode shapes are obtained for experimental and numerical results.
本研究分析了并联型和串联型压电双晶片的动态特性。通过两种非接触式光学技术和阻抗分析仪,实验研究了压电双晶片在正常和异常连接中的横向(离面)和平面(面内)振动。电子散斑干涉测量(ESPI)是测量共振频率和相应振动模态形状的主要实验技术。通过自行设计的 ESPI 光学装置获得了压电双晶片在共振时的面外和面内振动。激光多普勒测振仪(LDV)是一种用于面外位移的点测量技术,用于确定面外共振频率。阻抗分析仪用于测量面内运动的共振频率。实验结果表明,在正常连接中,面外模态是主导运动,只能激发出对称振动模态形状。面内运动足够大,可以使用 ESPI 方法进行测量。在并联连接中观察到了平行型压电双晶片的面内运动;然而,在串联连接中,对于串联型压电双晶片,面内模态形状与面外模态形状相似。因此,在正常连接中,压电双晶片在共振时的粒子运动基本上是三维的。有趣的是,尽管施加了较大的电压,但异常连接时既没有观察到面外振动模态形状,也没有观察到面内运动。除了实验方法外,还使用基于有限元法的数值计算来验证实验结果。实验和数值结果的共振频率和模态形状吻合较好。