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在籽粒镉积累量不同的硬粒小麦近等基因系成熟茎中镉的再转运。

Remobilization of cadmium in maturing shoots of near isogenic lines of durum wheat that differ in grain cadmium accumulation.

作者信息

Harris N S, Taylor G J

机构信息

Department of Biological Sciences, University of Alberta, Edmonton, Alberta, Canada T6G 2E9.

出版信息

J Exp Bot. 2001 Jul;52(360):1473-81. doi: 10.1093/jexbot/52.360.1473.

Abstract

Cadmium accumulation in grain of durum wheat (Triticum turgidum L. var. durum) represents a concern to consumers. In an effort to understand the regulation of Cd accumulation in maturing grain, the remobilization of 109Cd applied to stem and flag leaves was examined in two near-isogenic lines that differ in grain Cd accumulation. Absorbed 109Cd was primarily retained in the labelling flap (50-54% and 65-80% for stem and flag leaves, respectively). Cadmium exported from the stem flap initially (3 d) accumulated in the stem in a declining gradient towards the head. Subsequent remobilization of Cd deposited in the stem was associated with Cd accumulation in the grain. Cadmium exported from the flag leaf flap was primarily directed to the grain. Little (<1%) Cd accumulated in the glumes or rachis, and transport of Cd to shoot tissues below the flag leaf node was low (<1%). On average, 9% and 17% of absorbed 109Cd accumulated in the grain 14 d after labelling the stem and flag leaf, respectively. Irrespective of labelling position, the low Cd-accumulating isoline averaged 1.5-2-fold lower Cd accumulation per grain and Cd concentration in the grain than the high Cd-accumulating isoline. Cadmium accumulation in the grain was inversely correlated with Cd retention in the stem (stem labelled) and labelling flap (flag leaf labelled) for both isolines. Cadmium translocation to the grain was not inhibited by Zn when both were applied simultaneously (50 pM 109Cd; 0.5 microM 65Zn) to the flag leaf. These results show that elevated remobilization of Cd from the leaves and stem to the maturing grain may be partially responsible for the high accumulation of Cd in durum wheat grain.

摘要

硬粒小麦(Triticum turgidum L. var. durum)籽粒中的镉积累引起了消费者的关注。为了了解成熟籽粒中镉积累的调控机制,在两个籽粒镉积累量不同的近等基因系中,研究了施用于茎和旗叶的¹⁰⁹Cd的再转运情况。吸收的¹⁰⁹Cd主要保留在标记叶舌中(茎和旗叶分别为50 - 54%和65 - 80%)。最初从茎叶舌输出的镉(3天)以朝着穗部递减的梯度积累在茎中。随后茎中积累的镉的再转运与籽粒中的镉积累有关。从旗叶叶舌输出的镉主要运往籽粒。在颖片或穗轴中积累的镉很少(<1%),镉向旗叶节以下地上组织的转运也很低(<1%)。平均而言,在标记茎和旗叶14天后,吸收的¹⁰⁹Cd分别有9%和17%积累在籽粒中。无论标记位置如何,低镉积累近等基因系的每粒镉积累量和籽粒中的镉浓度平均比高镉积累近等基因系低1.5 - 2倍。两个近等基因系中,籽粒中的镉积累与茎(标记茎)和叶舌(标记旗叶)中镉的保留呈负相关。当同时向旗叶施用¹⁰⁹Cd(50 pM)和⁶⁵Zn(0.5 μM)时,锌不会抑制镉向籽粒的转运。这些结果表明,叶片和茎中镉向成熟籽粒的再转运增加可能是硬粒小麦籽粒中镉高积累的部分原因。

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