Nakai I, Terada Y, Itou M, Sakurai Y
Department of Applied Chemistry, Science University of Tokyo, Tokyo 162-8601, Japan.
J Synchrotron Radiat. 2001 Jul 1;8(4):1078-81. doi: 10.1107/s0909049501006410.
This study has revealed the advantages of the use of 116 keV X-rays as an excitation source of X-ray fluorescence (XRF) analyses. This technique is suitable for nondestructive multielemental analyses of heavy elements such as rare-earth elements. The lowest MDL value evaluated for the bulk analysis of a JG-1 standard reference sample (granite rock) was 0.1 ppm for W for a 500 s measurement. The spectrum of standard glass samples of SRM612 demonstrated clearly resolved K-line peaks of more than 30 elements, including all the existing rare-earth elements, at 50 ppm levels. The calibration curve for the determination of a rare-earth element shows a linear relation between the XRF intensity and concentrations from 10 to 0.03 ng. This powerful technique should be useful for nondestructive analyses of rare-earth and heavy elements in geological, geochemical and archaeological samples as well as industrial materials.
本研究揭示了使用116 keV X射线作为X射线荧光（XRF）分析激发源的优势。该技术适用于对稀土元素等重元素进行无损多元素分析。对JG-1标准参考样品（花岗岩）进行批量分析时，在500 s测量下，钨的最低检测限（MDL）值为0.1 ppm。SRM612标准玻璃样品的光谱清晰地分辨出了30多种元素的K线峰，包括所有现有的稀土元素，含量为50 ppm。用于测定稀土元素的校准曲线表明，XRF强度与10至0.03 ng的浓度之间呈线性关系。这项强大的技术对于地质、地球化学和考古样品以及工业材料中的稀土和重元素的无损分析应该是有用的。
