Blythe R A, Evans M R
Department of Physics and Astronomy, University of Edinburgh, Mayfield Road, Edinburgh EH9 3JZ, United Kingdom.
Phys Rev E Stat Nonlin Soft Matter Phys. 2001 Nov;64(5 Pt 1):051101. doi: 10.1103/PhysRevE.64.051101. Epub 2001 Oct 12.
The Kardar-Parisi-Zhang (KPZ) equation is accepted as a generic description of interfacial growth. In several recent studies, however, values of the roughness exponent alpha have been reported that are significantly less than that associated with the KPZ equation. A feature common to these studies is the presence of holes (bubbles and overhangs) in the bulk and an interface that is smeared out. We study a model of this type in which the density of the bulk and sharpness of the interface can be adjusted by a single parameter. Through theoretical considerations and the study of a simplified model we determine that the presence of holes does not affect the asymptotic KPZ scaling. Moreover, based on our numerics, we propose a simple form for the crossover to the KPZ regime.
Kardar-Parisi-Zhang（KPZ）方程被公认为界面生长的一般描述。然而，在最近的几项研究中，报道的粗糙度指数α的值明显小于与KPZ方程相关的值。这些研究的一个共同特征是在主体中存在孔洞（气泡和悬垂物）以及一个模糊的界面。我们研究了这种类型的一个模型，其中主体的密度和界面的清晰度可以通过一个单一参数进行调整。通过理论考虑和对一个简化模型的研究，我们确定孔洞的存在不会影响渐近的KPZ标度。此外，基于我们的数值计算，我们提出了一个向KPZ regime转变的简单形式。
