Purcell S T, Vincent P, Journet C, Binh Vu Thien
Laboratoire d'Emission Electronique, DPM UMR CNRS 5586, Université Lyon-1, Villeurbanne 69622, France.
Phys Rev Lett. 2002 Mar 11;88(10):105502. doi: 10.1103/PhysRevLett.88.105502. Epub 2002 Feb 20.
Field emission (FE) electron spectroscopy from an individual multiwalled carbon nanotube (MWNT) is used to measure quantitatively stable temperatures at the apex, T(A), of up to 2000 K induced by FE currents approximately 1 microA. The high T(A) is due to Joule heating along the length of the MWNT. These measurements also give directly the resistance of the individual MWNT which is shown to decrease with temperature, and explain the phenomenon of FE-induced light emission which was observed simultaneously. The heating permits thermal desorption of the MWNT and, hence, excellent current stability.
利用来自单个多壁碳纳米管(MWNT)的场发射(FE)电子能谱来定量测量由约1微安的场发射电流在顶端诱导产生的高达2000 K的稳定温度T(A)。高T(A)是由于沿MWNT长度方向的焦耳热所致。这些测量还直接给出了单个MWNT的电阻,结果表明该电阻随温度降低,并解释了同时观察到的场发射诱导发光现象。这种加热使得MWNT发生热脱附,因此具有出色的电流稳定性。