Woodside Michael T, McEuen Paul L
Department of Physics, University of California, Berkeley, CA 94720, USA.
Science. 2002 May 10;296(5570):1098-101. doi: 10.1126/science.1069923.
An atomic force microscope was used to study single-electron motion in nanotube quantum dots. By applying a voltage to the microscope tip, the number of electrons occupying the quantum dot could be changed, causing Coulomb oscillations in the nanotube conductance. Spatial maps of these oscillations were used to locate individual dots and to study the electrostatic coupling between the dot and the tip. The electrostatic forces associated with single electrons hopping on and off the quantum dot were also measured. These forces changed the amplitude, frequency, and quality factor of the cantilever oscillation, demonstrating how single-electron motion can interact with a mechanical oscillator.
利用原子力显微镜研究纳米管量子点中的单电子运动。通过向显微镜探针施加电压,可以改变占据量子点的电子数量,从而引起纳米管电导的库仑振荡。这些振荡的空间图谱被用于定位单个量子点,并研究量子点与探针之间的静电耦合。还测量了与单电子在量子点上的进出相关的静电力。这些力改变了悬臂振荡的幅度、频率和品质因数,证明了单电子运动如何与机械振荡器相互作用。