Luh D-A, Miller T, Paggel J J, Chiang T-C
Department of Physics, University of Illinois at Urbana-Champaign, 1110 West Green Street, Urbana, Illinois 61801-3080, USA.
Phys Rev Lett. 2002 Jun 24;88(25 Pt 1):256802. doi: 10.1103/PhysRevLett.88.256802. Epub 2002 Jun 5.
The strength of electron-phonon coupling in atomically uniform films of Ag on Fe is determined by angle-resolved photoemission from quantum well states in these films over a wide temperature range. As the film thickness is reduced, contributions from the surface and interface should become more important, and, experimentally, a large enhancement with superimposed quantum oscillations is observed. An analysis of the quantum oscillations indicates that this large enhancement is an interface effect.
通过在很宽的温度范围内对铁上银的原子均匀薄膜中量子阱态进行角分辨光电子能谱，确定了这些薄膜中电子 - 声子耦合的强度。随着薄膜厚度减小，表面和界面的贡献应该变得更加重要，并且在实验中观察到叠加量子振荡的大幅增强。对量子振荡的分析表明，这种大幅增强是一种界面效应。
