Seely John F
Space Science Division, US Naval Research Laboratory, Washington, DC 20375-5352, USA.
Appl Opt. 2002 Oct 1;41(28):5979-83. doi: 10.1364/ao.41.005979.
Thin-film interference has been observed in the transmittance of a filter consisting of 263.5-nm-thick magnesium with a 32.2-nm-thick aluminum layer on each side. The transmittance, measured by synchrotron radiation, has an oscillatory behavior in the 25-70-nm wavelength range. On the basis of the calculation of the transmittance, the oscillatory behavior results from interference associated with the relatively transmissive magnesium and aluminum layers and the reflection from the oxidized aluminum surface layers. The bandpass performance of magnesium and aluminum layers deposited on a silicon photodiode detector is presented.
在由厚度为263.5纳米的镁以及两侧各有一层厚度为32.2纳米的铝层组成的滤光片的透过率中观察到了薄膜干涉现象。通过同步辐射测量得到的透过率在25 - 70纳米波长范围内呈现出振荡行为。基于透过率的计算，这种振荡行为是由与相对透光的镁层和铝层相关的干涉以及氧化铝表面层的反射所导致的。文中还展示了沉积在硅光电二极管探测器上的镁层和铝层的带通性能。
