Robinson V N
J Microsc. 1975 Aug;104(3):287-92. doi: 10.1111/j.1365-2818.1975.tb04027.x.
The use of a wide angle backscattered electron detector in a scanning electron microscope, which has the capability of the specimen chamber pressure being controlled independently of the column pressure, provides a simple technique for examining frozen hydrated specimens. Large specimens have been examined within 1 min of being placed on the stub and have been examined for many hours without charging artefacts or distortion due to dehydration.
在扫描电子显微镜中使用广角背散射电子探测器，该探测器能够独立于柱体压力控制样品室压力，提供了一种检查冷冻水合标本的简单技术。大型标本在放置在样品台上后的1分钟内即可进行检查，并且可以检查数小时而不会出现充电伪像或因脱水导致的变形。
