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利用偏振反射率测定全息卤化银材料的折射率和厚度

Determination of the refractive index and thickness of holographic silver halide materials by use of polarized reflectances.

作者信息

Beléndez Augusto, Beléndez Tarsicio, Neipp Cristian, Pascual Inmaculada

机构信息

Departamento de Física, Ingeniería de Sistemas y Teoría de la Señal, Universidad de Alicante, Spain.

出版信息

Appl Opt. 2002 Nov 10;41(32):6802-8. doi: 10.1364/ao.41.006802.

DOI:10.1364/ao.41.006802
PMID:12440534
Abstract

A method to determine the refractive index and thickness of silver halide emulsions used in holography is presented. The emulsions are in the form of a layer of film deposited on a thick glass plate. The experimental reflectances of p-polarized light are measured as a function of the incident angles, and the values of refractive index, thickness, and extinction coefficient of the emulsion are obtained by using the theoretical equation for reflectance. As examples, five commercial holographic silver halide emulsions are analyzed. The procedure to obtain the measurements and the numerical analysis of the experimental data are simple, and agreement of the calculated reflectances, by use of the thickness and refractive index obtained, with the measured reflectances is satisfactory.

摘要

提出了一种确定用于全息术的卤化银乳剂折射率和厚度的方法。乳剂呈沉积在厚玻璃板上的薄膜层形式。测量p偏振光的实验反射率作为入射角的函数,并通过使用反射率的理论方程获得乳剂的折射率、厚度和消光系数值。作为示例,分析了五种市售全息卤化银乳剂。获得测量值的过程和实验数据的数值分析很简单,并且通过使用获得的厚度和折射率计算出的反射率与测量的反射率的一致性令人满意。

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