Fastl H
Audiology. 1976 Jan-Feb;15(1):63-71. doi: 10.3109/00206097609071764.
Temporal integration functions of tone bursts masked by critical band noises become shallower with increasing test tone frequency. This holds for tone bursts in the centre as well as at the slopes of the masking pattern of critical band maskers. When shortening the tone bursts, the horizontal masking pattern of uniform masking noise changes into a pattern with decreasing slope for increasing frequency. The shape of the masking pattern of critical band maskers remains rather independent of test tone duration.
被临界带宽噪声掩蔽的短纯音的时间整合函数会随着测试纯音频率的增加而变得更平缓。这适用于临界带宽掩蔽器掩蔽模式中心以及边缘的短纯音。当缩短短纯音时,均匀掩蔽噪声的水平掩蔽模式会随着频率增加而变为斜率减小的模式。临界带宽掩蔽器的掩蔽模式形状在很大程度上与测试纯音持续时间无关。