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通过乳房X线摄影实质模式确定的乳腺癌发生风险。

Risk for breast cancer development determined by mammographic parenchymal pattern.

作者信息

Wolfe J N

出版信息

Cancer. 1976 May;37(5):2486-92. doi: 10.1002/1097-0142(197605)37:5<2486::aid-cncr2820370542>3.0.co;2-8.

Abstract

A classification of risk for developing breast cancer has been devised based solely on the appearance of the breast parenchyma by mammography. Four groups of patients were isolated. The study encompassed a five-year period and was done by reviewing the mammograms of all women over the age of 30 who had been examined at Hutzel Hospital, Detroit. The average time of followup would be approximately 2 1/2 years. Four groups had an incidence of developing breast cancer of 0.1, 0.4, 1.7, and 2.2. These parenchymal patterns are described and criteria for their identification are given.

摘要

一种仅基于乳房X光检查中乳腺实质的表现而设计的乳腺癌发病风险分类方法已被制定出来。分离出了四组患者。该研究为期五年,通过回顾底特律胡茨尔医院所有30岁以上接受过检查的女性的乳房X光片来进行。平均随访时间约为2.5年。四组患乳腺癌的发生率分别为0.1、0.4、1.7和2.2。文中描述了这些实质模式并给出了识别它们的标准。

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