Sigle W, Krämer S, Varshney V, Zern A, Eigenthaler U, Rühle M
Max-Planck-Institut für Metallforschung, Heisenbergstrasse 3, D-70569, Stuttgart, Germany.
Ultramicroscopy. 2003 Sep;96(3-4):565-71. doi: 10.1016/S0304-3991(03)00117-7.
In this paper, we demonstrate the two-dimensional mapping of plasmon energies by energy-filtering transmission electron microscopy. The maps are obtained from a series of energy-filtered images in the plasmon energy region. Examples are shown for a nano-crystalline Si-B-C-N ceramic. This material contains SiC and Si(3)N(4) grains as well as intergranular regions composed of hexagonal BN (h-BN) and turbostratic carbon (t-C). The different phases can be clearly identified by their specific plasmon energies. An energy resolution of < or =0.1eV is achieved. In addition, the plasmon map of an amorphous carbon film is used to visualize the non-isochromaticity of the Corrected Omega filter (90 degrees filter) of the SESAM2. A procedure is proposed for the correction of the non-isochromaticity.
在本文中,我们通过能量过滤透射电子显微镜展示了等离激元能量的二维映射。这些映射图是从等离激元能量区域的一系列能量过滤图像中获得的。给出了纳米晶Si-B-C-N陶瓷的示例。这种材料包含SiC和Si₃N₄晶粒以及由六方氮化硼(h-BN)和乱层碳(t-C)组成的晶界区域。不同相可以通过其特定的等离激元能量清晰识别。实现了≤0.1eV的能量分辨率。此外,非晶碳膜的等离激元映射图用于可视化SESAM2校正欧米伽滤波器(90度滤波器)的非等色性。提出了一种校正非等色性的程序。