Erbe Eric F, Rango Albert, Foster James, Josberger Edward G, Pooley Christopher, Wergin William P
Henry Wallace Beltsville Agricultural Research Center, USDA-ARS, Beltsville, Maryland 20705, USA.
Microsc Res Tech. 2003 Sep 1;62(1):19-32. doi: 10.1002/jemt.10383.
Methods to collect, transport, and store samples of snow and ice have been developed that enable detailed observations of these samples with a technique known as low-temperature scanning electron microscopy (LTSEM). This technique increases the resolution and ease with which samples of snow and ice can be observed, studied, and photographed. Samples are easily collected in the field and have been shipped to the electron microscopy laboratory by common air carrier from distances as far as 5,000 miles. Delicate specimens of snow crystals and ice grains survive the shipment procedures and have been stored for as long as 3 years without undergoing any structural changes. The samples are not subjected to the melting or sublimation artifacts. LTSEM allows individual crystals to be observed for several hours with no detectable changes. Furthermore, the instrument permits recording of photographs containing the parallax information necessary for three-dimensional imaging of the true shapes of snowflakes, snow crystals, snow clusters, ice grains, and interspersed air spaces. This study presents detailed descriptions of the procedures that have been used successfully in the field and the laboratory to collect, ship, store, and image snow crystals and ice grains.
已经开发出收集、运输和储存冰雪样本的方法，这些方法能够使用低温扫描电子显微镜（LTSEM）技术对这些样本进行详细观察。该技术提高了观察、研究和拍摄冰雪样本的分辨率和便利性。样本在野外很容易收集，并且已经通过普通航空运输从5000英里外的地方运送到电子显微镜实验室。精致的雪晶和冰晶样本在运输过程中得以保存，并且已经储存了长达3年而没有发生任何结构变化。样本不会受到融化或升华假象的影响。LTSEM可以对单个晶体进行数小时的观察而没有可检测到的变化。此外，该仪器允许记录包含雪花、雪晶、雪团、冰晶和散布的空气间隙真实形状的三维成像所需视差信息的照片。本研究详细描述了在野外和实验室中成功用于收集、运输、储存和成像雪晶和冰晶的程序。
