Guignes P, Faure J, Maurette A
Département d'Odontologie Conservatrice-Endodontie, Faculté de Chirurgie-Dentaire, Toulouse III, France.
Bull Group Int Rech Sci Stomatol Odontol. 1992 Sep-Dec;35(3-4):99-105.
The aim of this study is to compare two computerized analysis methods of SEM dentinal walls views. The first technic is an indirect one using a primary marking and a secondary measurement. The second one is a direct threshold analyse, using the grey levels selection. The influence of the magnification is analysed in a second part. The first technic is considered as a reference one. The results show that the threshold measurement technic is only reliable at a high magnification. A direct surface measurement cannot be used at a low magnification. A pretreatment could enhance the ability of a computer to measure the areas covered with smear-layer or organic debris on SEM micrographs.
本研究的目的是比较扫描电子显微镜（SEM）牙本质壁视图的两种计算机化分析方法。第一种技术是间接技术，使用一次标记和二次测量。第二种是直接阈值分析，使用灰度选择。第二部分分析了放大倍数的影响。第一种技术被视为参考技术。结果表明，阈值测量技术仅在高放大倍数下可靠。低放大倍数下不能使用直接表面测量。预处理可以增强计算机测量扫描电子显微镜显微照片上覆盖有玷污层或有机碎屑区域的能力。
