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活性突变元件抑制了结节表型,并增加了Kn1-O串联重复处的重组。

Active Mutator elements suppress the knotted phenotype and increase recombination at the Kn1-O tandem duplication.

作者信息

Lowe B, Mathern J, Hake S

机构信息

USDA-ARS Plant Gene Expression Center, Albany, California 94710.

出版信息

Genetics. 1992 Nov;132(3):813-22. doi: 10.1093/genetics/132.3.813.

Abstract

The KNOTTED-1 (KN1) locus is defined by a number of dominant mutations that affect leaf development. The Kn1-O mutation is characterized by outpocketings of tissue along lateral veins of the maize leaf and by displacement of ligule tissue from the junction of the blade and sheath into the blade. Kn1-O results from a tandem duplication of 17 kb; each repeat includes the entire 8-kb KN1 transcription unit. Mutator (Mu) transposable elements inserted at the junction of the two repeats diminish the mutant phenotype. The Mu insertions affect the Kn1-O mutation in several distinctive ways. (1) Two of the three Mu elements, a Mu1 and a Mu8 element, diminish the mutant phenotype only when active as indicated by hypomethylation; when methylated or inactive, the phenotype is comparable to the Kn1-O progenitor. (2) Additional rearrangements have arisen in these derivatives that further reduce the mutant phenotype. (3) A 100-2000-fold increase in the loss of one repeat occurs in the presence of Mu elements as compared to Kn1-O without elements. The high frequency of loss only occurs when the Mu elements are hypomethylated. The frequency is also influenced by the specific allele carried at the same locus on the homologous chromosome. Reciprocal exchange of flanking markers does not accompany the loss events. Various recombination models that address the events occurring at Kn1-O are presented.

摘要

KNOTTED-1(KN1)基因座由多个影响叶片发育的显性突变所定义。Kn1-O突变的特征是沿着玉米叶片侧脉出现组织外突,以及叶舌组织从叶片与叶鞘的连接处移位到叶片中。Kn1-O是由一个17 kb的串联重复产生的;每个重复序列都包含完整的8 kb KN1转录单元。插入两个重复序列连接处的Mutator(Mu)转座元件会减弱突变表型。Mu插入以几种独特的方式影响Kn1-O突变。(1)三个Mu元件中的两个,一个Mu1元件和一个Mu8元件,只有在如低甲基化所示的活跃状态下才会减弱突变表型;当甲基化或不活跃时,表型与Kn1-O原始类型相当。(2)这些衍生物中出现了进一步降低突变表型的其他重排。(3)与没有元件的Kn1-O相比,在有Mu元件的情况下,一个重复序列丢失的频率增加了100 - 2000倍。只有当Mu元件低甲基化时才会出现高频率的丢失。频率也受到同源染色体上同一基因座携带的特定等位基因的影响。侧翼标记的相互交换并不伴随丢失事件。本文提出了各种解释在Kn1-O发生的事件的重组模型。

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