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重度联合免疫缺陷(scid)小鼠突变体中的B细胞和T细胞渗漏

B and T cell leakiness in the scid mouse mutant.

作者信息

Bosma M J

机构信息

Institute for Cancer Research, Fox Chase Cancer Center, Philadelphia, PA 19111.

出版信息

Immunodefic Rev. 1992;3(4):261-76.

PMID:1449786
Abstract

Recombination of antigen receptor gene elements (V, D and J) that code for Ig and TCR variable regions is defective in the scid mouse mutant. However, the defect is not absolute. Developing scid lymphocytes occasionally succeed in forming a productive VDJ and VJ rearrangement at two critical loci (e.g., IgH/IgL or TCR beta/TCR alpha), and given the appropriate stimuli, differentiate into clones of functional B or T cells. Scid mice with detectable B and/or T lymphocytes are referred to as leaky. This review considers the nature and possible basis of B and T cell leakiness in scid mice.

摘要

在严重联合免疫缺陷(scid)小鼠突变体中,编码免疫球蛋白(Ig)和T细胞受体(TCR)可变区的抗原受体基因元件(V、D和J)的重组存在缺陷。然而,这种缺陷并非绝对。发育中的scid淋巴细胞偶尔会成功地在两个关键位点(如IgH/IgL或TCRβ/TCRα)形成有效的VDJ和VJ重排,并且在受到适当刺激后,分化为功能性B细胞或T细胞克隆。具有可检测到的B和/或T淋巴细胞的scid小鼠被称为渗漏型。本综述探讨了scid小鼠中B细胞和T细胞渗漏的本质及可能的基础。

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