Antonello Sabrina, Daasbjerg Kim, Jensen Henrik, Taddei Ferdinando, Maran Flavio
Dipartimento di Chimica Fisica, Università di Padova, via Loredan 2, 35131 Padua, Italy.
J Am Chem Soc. 2003 Dec 3;125(48):14905-16. doi: 10.1021/ja036380g.
The electron transfer (ET) to a series of para-substituted diaryl disulfides, having the general formula (X-C(6)H(4)S-)(2), has been studied. The X groups were selected as to have a comprehensive variation of the substituent effect, being X = NH(2), MeO, H, F, Cl, CO(2)Et, CN, and NO(2). The reduction was carried out experimentally, using N,N-dimethylformamide as the solvent, and by molecular orbital (MO) ab initio calculations. The ET was studied heterogeneously, by voltammetric reduction and convolution analysis, and homogeneously, by using electrogenerated radical anions as the solution electron donors. The reduction is dissociative, leading to the cleavage of the S-S bond in a stepwise manner. Both experimental approaches led us to estimate the E degrees and the intrinsic barrier values for the formation of the radical anions. Comparison of the independently obtained results allowed obtaining, for the first time, a quantitative description of the correlation between heterogeneous and homogeneous rate constants of ETs associated with significant inner reorganization energy. The experimental outcome was fully supported by the theoretical calculations, which provided information about the disulfide lowest unoccupied MOs (LUMOs) and singly occupied MO (SOMO), the bond dissociation energies, and the most significant structural modifications associated with radical anion formation. With disulfides bearing electron-donating or mildly electron-withdrawing groups, the inner reorganization is particularly large, which reflects the significant stretching of the S-S bond experienced by the molecule upon ET. The process entails formation of loose radical anion species in which the SOMO is heavily localized, as the LUMO, onto the frangible bond. As a consequence of the formation of these sigma-radical anions, the S-S bond energy of the latter is rather small and the cleavage rate constant is very large. With electron-withdrawing groups, the extent of delocalization of the SOMO onto the aryl system increases, leading to a decrease of the reorganization energy for radical anion formation. Interestingly, while the LUMO now has pi character, the actual reduction intermediate (and thus the SOMO) is still a sigma-type radical anion. With the nitro-substituted disulfide, very limited inner reorganization is required and a pi-radical anion initially forms. A nondissociative type intramolecular ET then ensues, leading to the formation of a new radical anion whose antibonding orbital has similar features as those of the SOMO of the other diaryl disulfides. Therefore, independently of the substituent, the actual S-S bond cleavage occurs in a quite similar way along the series investigated. The S-S bond cleavage rate, however, tends to decrease as the Hammett sigma increases, which would be in keeping with an increase of both the electronic and solvent reorganization energies.
已对一系列通式为(X-C₆H₄S-)₂的对取代二芳基二硫化物的电子转移(ET)进行了研究。选择X基团以全面改变取代基效应,X = NH₂、MeO、H、F、Cl、CO₂Et、CN和NO₂。使用N,N-二甲基甲酰胺作为溶剂通过实验进行还原,并通过分子轨道(MO)从头算进行计算。通过伏安还原和卷积分析对ET进行非均相研究,并通过使用电生成的自由基阴离子作为溶液电子供体进行均相研究。还原是解离性的,导致S-S键逐步断裂。两种实验方法都使我们能够估计自由基阴离子形成的E°和本征势垒值。对独立获得的结果进行比较,首次得到了与显著内重组能相关的ET非均相和均相速率常数之间相关性的定量描述。理论计算完全支持了实验结果,理论计算提供了有关二硫化物最低未占分子轨道(LUMO)和单占分子轨道(SOMO)、键解离能以及与自由基阴离子形成相关的最显著结构修饰的信息。对于带有供电子或轻度吸电子基团的二硫化物,内重组特别大,这反映了分子在ET时S-S键的显著拉伸。该过程导致形成松散的自由基阴离子物种,其中SOMO像LUMO一样严重定域在易断裂键上。由于这些σ-自由基阴离子的形成,后者的S-S键能相当小且裂解速率常数非常大。对于吸电子基团,SOMO在芳基体系上的离域程度增加,导致自由基阴离子形成的重组能降低。有趣的是,虽然LUMO现在具有π特征,但实际的还原中间体(因此SOMO)仍然是σ型自由基阴离子。对于硝基取代的二硫化物,所需的内重组非常有限,最初形成π-自由基阴离子。然后发生非解离型分子内ET,导致形成一种新的自由基阴离子,其反键轨道具有与其他二芳基二硫化物的SOMO相似的特征。因此,与取代基无关,在所研究的系列中实际的S-S键断裂以非常相似的方式发生。然而,S-S键的裂解速率随着哈米特σ的增加而趋于降低,这与电子和溶剂重组能的增加一致。