Suppr超能文献

不同固化灯类型和方法之间的固化深度比较。

Comparative depths of cure among various curing light types and methods.

作者信息

Soh M S, Yap Adrian U J, Siow K S

机构信息

Department of Restorative Dentistry, Faculty of Dentistry, National University of Singapore, Republic of Singapore.

出版信息

Oper Dent. 2004 Jan-Feb;29(1):9-15.

Abstract

This study evaluated the depth of cure associated with commercial LEDs (light-emitting diodes) (Elipar FreeLight [FL], 3M-ESPE; GC e-Light [EL], GC), high intensity (Elipar TriLight [TL], 3M-ESPE) and very high intensity (Astralis 10 [AS], Ivoclar Vivadent) Quartz Tungsten Halogen (QTH) curing lights. Depth of cure of the various lights/curing modes were compared to a conventional QTH light (Max [Mx], Dentsply-Caulk). Ten exposure regimens were investigated: FL1 - 400 mW/cm2 [40 seconds]; FL2 - 0-400 mW/cm2 [12 seconds] --> 400 mW/cm2 [28 seconds]; EL1 - 750 mW/cm2 [10 pulses x 2 seconds], EL2 - 350 mW/cm2 [40 seconds]; EL3 - 600 mW/cm2 [20 seconds]; EL4 - 0 - 600 mW/cm2 [20 seconds] --> 600 mW/cm2 [20 seconds]; TL1 - 800 mW/cm2 [40 seconds]; TL2 - 100- 800 mW/cm2 [15 seconds] --> 800 mW/cm2 [25 seconds]; AS1 - 1200 mW/cm2 [10 seconds]; MX - 400 mW/cm2 [40 seconds]. Depth of cure was determined by penetration, scraping and microhardness techniques. The results were analyzed using one-way ANOVA/Scheffe's post-hoc test and Pearson's correlation at significance level 0.05 and 0.01, respectively. All light curing regimens met the ISO depth of cure requirement of 1.5 mm with the exception of EL1-EL3 with the microhardness technique. Curing with most modes of EL resulted in significantly lower depths of cure than the control [MX]. No significant difference in depth of cure was observed among the control and the two modes of FL. Curing with TL1 resulted in significantly greater depth of cure compared to MX with all testing techniques. No significant difference in depth of cure was observed between the control and AS1 for all testing techniques except for the penetration technique. The depth of composite cure is light unit and exposure mode dependent. Scraping and penetration techniques were found to correlate well but tend to overestimate depth of cure compared to microhardness.

摘要

本研究评估了与商用发光二极管(LED)(3M-ESPE公司的Elipar FreeLight [FL]、GC公司的GC e-Light [EL])、高强度(3M-ESPE公司的Elipar TriLight [TL])和超高强度(义获嘉伟瓦登特公司的Astralis 10 [AS])石英钨卤(QTH)固化灯相关的固化深度。将各种灯光/固化模式的固化深度与传统QTH灯(登士柏-卡沃公司的Max [Mx])进行比较。研究了十种曝光方案:FL1 - 400 mW/cm² [40秒];FL2 - 0 - 400 mW/cm² [12秒] --> 400 mW/cm² [28秒];EL1 - 750 mW/cm² [10次脉冲×2秒],EL2 - 350 mW/cm² [40秒];EL3 - 600 mW/cm² [20秒];EL4 - 0 - 600 mW/cm² [20秒] --> 600 mW/cm² [20秒];TL1 - 800 mW/cm² [40秒];TL2 - 100 - 800 mW/cm² [15秒] --> 800 mW/cm² [25秒];AS1 - 1200 mW/cm² [10秒];MX - 400 mW/cm² [40秒]。通过渗透、刮擦和显微硬度技术测定固化深度。分别使用单因素方差分析/谢费事后检验和皮尔逊相关性分析对结果进行分析,显著性水平分别为0.05和0.01。除了使用显微硬度技术的EL1 - EL3外,所有光固化方案均满足1.5毫米的ISO固化深度要求。使用EL的大多数模式进行固化导致的固化深度明显低于对照组[Mx]。在对照组和FL的两种模式之间未观察到固化深度的显著差异。使用TL1进行固化在所有测试技术下导致的固化深度均显著大于Mx。除了渗透技术外,在所有测试技术下,对照组和AS1之间未观察到固化深度的显著差异。复合树脂的固化深度取决于光固化设备和曝光模式。发现刮擦和渗透技术相关性良好,但与显微硬度相比,往往会高估固化深度。

文献AI研究员

20分钟写一篇综述,助力文献阅读效率提升50倍。

立即体验

用中文搜PubMed

大模型驱动的PubMed中文搜索引擎

马上搜索

文档翻译

学术文献翻译模型,支持多种主流文档格式。

立即体验