Volkov V V, Zhu Y
Materials Science Department, Brookhaven National Laboratory, Upton, NY 11973, USA.
Ultramicroscopy. 2004 Jan;98(2-4):271-81. doi: 10.1016/j.ultramic.2003.08.026.
We propose a method of Lorentz phase microscopy for in situ studies and imaging magnetic materials in transmission electron microscopy (TEM) based on the solution of the magnetic transport-of-intensity equation. We also describe the appropriate way of solving this equation that may be useful for understanding and practical use of non-holographic methods for phase retrieval in electron microscopy, especially in imaging magnetic materials. The method is simple, since it is primarily based on classical Fresnel imaging. On the other hand, it is quantitative and can be applied in any TEM without changing the basic hardware. Therefore, it may well find important practical applications in ultramicroscopy and modern magnetic materials research.
我们提出了一种基于磁强度传输方程解的洛伦兹相显微镜方法,用于在透射电子显微镜(TEM)中对磁性材料进行原位研究和成像。我们还描述了求解该方程的合适方法,这可能有助于理解和实际应用电子显微镜中非全息相位恢复方法,特别是在磁性材料成像方面。该方法很简单,因为它主要基于经典菲涅耳成像。另一方面,它是定量的,并且可以在任何TEM中应用而无需改变基本硬件。因此,它很可能在超显微镜和现代磁性材料研究中找到重要的实际应用。